They are precision-engineered tips used in Atomic Force Microscopy (AFM) to scan and measure surfaces at the nanoscale

The detailed output obtained from scanning a sample's surface with an AFM

High-resolution imaging technique used to analyze surfaces at the nanoscale

The dual perspective helps in understanding the design and functionality of the probe

Indicating the application type with additional identifiers

Ideal for research and industry

A foundational element in the production of high-precision AFM tips