50 Piece AFM Tip Package

A 50 Piece AFM Tip Package contains 50 individual Atomic Force Microscopy (AFM) tips. These tips are precision-engineered probes used in AFM to scan and measure surface properties at the nanoscale.

The package ensures a supply of high-quality, uniform tips for consistent and reliable AFM measurements. It's ideal for researchers and industries needing multiple tips for various experiments or quality control processes.

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4-inch AFM Tip Wafer