Product Categorization

The naming convention combines a letter indicating the application type with additional identifiers for specific features or models.

Contact Probes (C):

Designed for contact mode AFM, where the tip remains in constant contact with the sample surface. Ideal for high-resolution imaging of hard surfaces.

Non-contact Probes (N):

Used in non-contact or tapping mode AFM, where the tip oscillates near the sample surface without touching it. Suitable for delicate or soft samples to avoid damage.

Electrical Probes (E):

Equipped with conductive properties for measuring electrical properties of the sample, such as conductivity and potential.

Magnetic Probes (M):

Designed for magnetic force microscopy (MFM) to measure magnetic properties of the sample surface.